When electronic products are subjected to high-temperature aging , they have the need for power-on and communication tests. Some electronic products are aged under the low-level process of semi-finished products, and some of them are products that are directly aged. Most of the aging of finished products have relatively simple and convenient wiring methods during power-on and communication testing, and they can be connected to the leads or ports of the products. The aging of semi-finished products requires more power and communication tests because the semi-finished products generally do not have leads and terminals, but only the hole positions of the wiring are reserved on the circuit board, and the aging power and communication cannot destroy semi-finished products. Therefore, these semi-finished products When aging, it is necessary to design an aging test bench that can quickly connect power and communication.
The aging test bench is mainly composed of a main housing, a quick presser, a needle plate, a needle tube, a lead wire, a switch and the like.
LED aging test bench main shell made of orange wood, because bakelite is a solid plastic, heat-resistant, not aging, and high mechanical strength, corrosion resistance. Standardized design and processing can replace the corresponding pin board and carrier board for different circuit boards without replacing the entire test bench.
The quick presser is a standard product in the market, and the replacement is changed. In the aging test, the circuit board can be powered on simply by pressing the handle, which is convenient and quick, and the operation time is saved.
The barrel of the burn-in test bench is mainly made of phosphor bronze tube gold plating; spring: stainless steel wire; needle: phosphor bronze (nickel plating). According to the different semi-finished products, different needles are used. (Figure 3)
Aging test bench test version accuracy: dimensional tolerances can reach ± ​​0.01MM; one-time processing concentricity ⊙ 0.005MM; one-time processing parallelism ∥ 0.01MM; unilateral verticality ⊥ 0.01MM.
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